MPI CORORATION SEMICONChina 2019!

2019-03-22 探针台


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话题标签SEMICONChina 2019!
新国际博览中心3151展位 Exhibition: March 20 – 22
Venue: Booth No. 3151, New International Expo Centre, Shanghai

话题标签ProbeCardTechnologies 话题标签PhotonicsAutomation
话题标签AdvancedSemiconductorTest 话题标签ThermalTest

MPI Probe Card Technologies探测卡技术:
http://bit.ly/MPI-PC
MPI Photonics Automation光子学自动化:
http://bit.ly/MPI-PA
MPI Advanced Semiconductor Test高级半导体测试:
http://bit.ly/MPI-AST
MPI Thermal Test Solutions热测试解决方案:
http://bit.ly/MPI-Thermal


南京宇微系统集成有限公司|探针台系统|MPI探针台|校准件|负载牵引系统|射频探针|微光显微镜|晶圆在片测试

手机:13728761743

电话:025-52767811

邮箱:xch@m-test.cn

地点:江苏省南京市江宁区天元中路126号新城发展中心2栋1111